Measuring Overfitting in Convolutional Neural Networks using Adversarial
Perturbations and Label Noise

Measuring Overfitting in Convolutional Neural Networks using Adversarial Perturbations and Label Noise

IEEE Symposium Series on Computational Intelligence (IEEE SSCI), 2022

27 September 2022

Svetlana Pavlitskaya

J. Marius Zöllner

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