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Analyzing Deviations of Dyadic Lines in Fast Hough Transform

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Abstract

Fast Hough transform is a widely used algorithm in pattern recognition. The algorithm relies on approximating lines using a specific discrete line model called dyadic lines. The worst-case deviation of a dyadic line from the ideal line it used to construct grows as O(log(n))O(log(n)), where nn is the linear size of the image. But few lines actually reach the worst-case bound. The present paper addresses a statistical analysis of the deviation of a dyadic line from its ideal counterpart. Specifically, our findings show that the mean deviation is zero, and the variance grows as O(log(n))O(log(n)). As nn increases, the distribution of these (suitably normalized) deviations converges towards a normal distribution with zero mean and a small variance. This limiting result makes an essential use of ergodic theory.

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