Test-Time Discovery via Hashing Memory

We introduce Test-Time Discovery (TTD) as a novel task that addresses class shifts during testing, requiring models to simultaneously identify emerging categories while preserving previously learned ones. A key challenge in TTD is distinguishing newly discovered classes from those already identified. To address this, we propose a training-free, hash-based memory mechanism that enhances class discovery through fine-grained comparisons with past test samples. Leveraging the characteristics of unknown classes, our approach introduces hash representation based on feature scale and directions, utilizing Locality-Sensitive Hashing (LSH) for efficient grouping of similar samples. This enables test samples to be easily and quickly compared with relevant past instances. Furthermore, we design a collaborative classification strategy, combining a prototype classifier for known classes with an LSH-based classifier for novel ones. To enhance reliability, we incorporate a self-correction mechanism that refines memory labels through hash-based neighbor retrieval, ensuring more stable and accurate class assignments. Experimental results demonstrate that our method achieves good discovery of novel categories while maintaining performance on known classes, establishing a new paradigm in model testing. Our code is available atthis https URL.

@article{lyu2025_2503.10699,
  title={ Test-Time Discovery via Hashing Memory },
  author={ Fan Lyu and Tianle Liu and Zhang Zhang and Fuyuan Hu and Liang Wang },
  journal={arXiv preprint arXiv:2503.10699},
  year={ 2025 }
}