Faster and Memory-Efficient Training of Sequential Recommendation Models for Large Catalogs

Sequential recommendations (SR) with transformer-based architectures are widely adopted in real-world applications, where SR models require frequent retraining to adapt to ever-changing user preferences. However, training transformer-based SR models often encounters a high computational cost associated with scoring extensive item catalogs, often exceeding thousands of items. This occurs mainly due to the use of cross-entropy loss, where peak memory scales proportionally to catalog size, batch size, and sequence length. Recognizing this, practitioners in the field of recommendation systems typically address memory consumption by integrating the cross-entropy (CE) loss with negative sampling, thereby reducing the explicit memory demands of the final layer. However, a small number of negative samples would degrade model performance, and as we demonstrate in our work, increasing the number of negative samples and the batch size further improves the model's performance, but rapidly starts to exceed industrial GPUs' size (~40Gb).