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Automated Classification of Helium Ingress in Irradiated X-750
9 December 2019
Chris Anderson
Jacob Klein
H. Rajakumar
C. Judge
L. Béland
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Papers citing
"Automated Classification of Helium Ingress in Irradiated X-750"
2 / 2 papers shown
Multi defect detection and analysis of electron microscopy images with deep learning
Mingren Shen
Guanzhao Li
Dongxian Wu
Yuhan Liu
J. Greaves
...
Bryan Sanchez
Oigimer Torres
Wei Li
Kevin G. Field
D. Morgan
102
50
0
19 Aug 2021
A Deep Learning Based Automatic Defect Analysis Framework for In-situ TEM Ion Irradiations
Mingren Shen
Guanzhao Li
Dongxian Wu
Y. Yaguchi
J. C. Haley
Kevin G. Field
D. Morgan
160
55
0
19 Aug 2021
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