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2001.05022
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Machine Learning Pipeline for Segmentation and Defect Identification from High Resolution Transmission Electron Microscopy Data
14 January 2020
Catherine K. Groschner
Christina Choi
M. Scott
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Papers citing
"Machine Learning Pipeline for Segmentation and Defect Identification from High Resolution Transmission Electron Microscopy Data"
4 / 4 papers shown
Title
Self-Supervised Learning with Generative Adversarial Networks for Electron Microscopy
Bashir Kazimi
Karina Ruzaeva
Stefan Sandfeld
46
5
0
28 Feb 2024
Unsupervised segmentation of irradiation
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2010
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2010
induced order
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2010
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2010
disorder phase transitions in electron microscopy
Arman H. Ter-Petrosyan
Jenna A. Bilbrey
Christina Doty
Bethany E. Matthews
Le Wang
Yingge Du
E. Lang
Khalid Hattar
Steven Spurgeon
29
0
0
14 Nov 2023
Artificial Intelligence in Material Engineering: A review on applications of AI in Material Engineering
Lipichanda Goswami
Manoj Deka
Mohendra Roy
AI4CE
42
19
0
15 Sep 2022
Understanding the Influence of Receptive Field and Network Complexity in Neural-Network-Guided TEM Image Analysis
Katherine Sytwu
Catherine K. Groschner
M. Scott
16
11
0
08 Apr 2022
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