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 Stein -Importance SamplingNeural Information Processing Systems (NeurIPS), 2023 |
 Using Perturbation to Improve Goodness-of-Fit Tests based on Kernelized
Stein DiscrepancyInternational Conference on Machine Learning (ICML), 2023 |
 A kernel Stein test of goodness of fit for sequential modelsInternational Conference on Machine Learning (ICML), 2022 |
 Gradient-Free Kernel Stein DiscrepancyNeural Information Processing Systems (NeurIPS), 2022 |
 Gradient Estimation with Discrete Stein OperatorsNeural Information Processing Systems (NeurIPS), 2022 |
 Kernel Stein Discrepancy DescentInternational Conference on Machine Learning (ICML), 2021 |
 Post-Processing of MCMCAnnual Review of Statistics and Its Application (ARSIA), 2021 |
 Semi-Exact Control Functionals From Sard's MethodBiometrika (Biometrika), 2020 |
