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2002.01225
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Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling
4 February 2020
Étienne Monier
Thomas Oberlin
N. Brun
Xiaoyan Li
M. Tencé
N. Dobigeon
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Papers citing
"Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling"
2 / 2 papers shown
Regularization via deep generative models: an analysis point of view
International Conference on Information Photonics (ICIP), 2021
Thomas Oberlin
Mathieu Verm
GAN
165
8
0
21 Jan 2021
Learning to Scan: A Deep Reinforcement Learning Approach for Personalized Scanning in CT Imaging
Inverse Problems and Imaging (IPI), 2020
Ziju Shen
Yufei Wang
Dufan Wu
Xu Yang
Bin Dong
OffRL
470
28
0
03 Jun 2020
1
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