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Quantum Computing Assisted Deep Learning for Fault Detection and
  Diagnosis in Industrial Process Systems
v1v2 (latest)

Quantum Computing Assisted Deep Learning for Fault Detection and Diagnosis in Industrial Process Systems

Computers and Chemical Engineering (CCE), 2020
29 February 2020
Akshay Ajagekar
Fengqi You
ArXiv (abs)PDFHTML

Papers citing "Quantum Computing Assisted Deep Learning for Fault Detection and Diagnosis in Industrial Process Systems"

2 / 2 papers shown
Quantum enhanced ensemble GANs for anomaly detection in continuous biomanufacturing
Quantum enhanced ensemble GANs for anomaly detection in continuous biomanufacturing
Rajiv Kailasanathan
William R. Clements
Mohammad Reza Boskabadi
Shawn M. Gibford
Emmanouil Papadakis
Christopher J. Savoie
Seyed Soheil Mansouri
109
2
0
29 Aug 2025
Semiconductor Defect Detection by Hybrid Classical-Quantum Deep Learning
Semiconductor Defect Detection by Hybrid Classical-Quantum Deep LearningComputer Vision and Pattern Recognition (CVPR), 2022
Yuanfu Yang
Min Sun
236
60
0
06 Aug 2022
1
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