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Learning Assisted Side Channel Delay Test for Detection of Recycled ICs

Learning Assisted Side Channel Delay Test for Detection of Recycled ICs

Asia and South Pacific Design Automation Conference (ASP-DAC), 2020
23 October 2020
Ashka Vakil
Farzad Niknia
Ali Mirzaeian
Avesta Sasan
Naghmeh Karimi
ArXiv (abs)PDFHTML

Papers citing "Learning Assisted Side Channel Delay Test for Detection of Recycled ICs"

1 / 1 papers shown
Path Planning using Reinforcement Learning: A Policy Iteration Approach
Path Planning using Reinforcement Learning: A Policy Iteration Approach
Saumil Shivdikar
J. Nirmal
OffRL
154
1
0
13 Mar 2023
1
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