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 Optimization of Rank Losses for Image RetrievalIEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI), 2023 |
 Introspective Deep Metric LearningIEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI), 2023 |
 Metric Learning as a Service with Covariance EmbeddingIEEE Transactions on Services Computing (IEEE TSC), 2022 |
 Understanding Open-Set Recognition by Jacobian Norm and Inter-Class
SeparationPattern Recognition (Pattern Recogn.), 2022 |
 Deep Metric Learning with Chance ConstraintsIEEE Workshop/Winter Conference on Applications of Computer Vision (WACV), 2022 |
 Neural Bregman Divergences for Distance LearningInternational Conference on Learning Representations (ICLR), 2022 |
 Non-isotropy Regularization for Proxy-based Deep Metric LearningComputer Vision and Pattern Recognition (CVPR), 2022 |
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 Informative and Representative Triplet Selection for Multilabel Remote
Sensing Image RetrievalIEEE Transactions on Geoscience and Remote Sensing (TGRS), 2021 |
