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A New Similarity Space Tailored for Supervised Deep Metric Learning
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A New Similarity Space Tailored for Supervised Deep Metric Learning

ACM Transactions on Intelligent Systems and Technology (ACM TIST), 2020
16 November 2020
P. H. Barros
Fabiane Queiroz
Flavio Figueredo
J. A. dos Santos
Heitor S. Ramos
    DRL
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