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Parallel-beam X-ray CT datasets of apples with internal defects and
  label balancing for machine learning

Parallel-beam X-ray CT datasets of apples with internal defects and label balancing for machine learning

24 December 2020
S. Coban
Vladyslav Andriiashen
P. Ganguly
Maureen van Eijnatten
K. Batenburg
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Papers citing "Parallel-beam X-ray CT datasets of apples with internal defects and label balancing for machine learning"

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