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Fully Convolutional Cross-Scale-Flows for Image-based Defect Detection

Fully Convolutional Cross-Scale-Flows for Image-based Defect Detection

6 October 2021
Marco Rudolph
Tom Wehrbein
Bodo Rosenhahn
Bastian Wandt
    UQCV
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Papers citing "Fully Convolutional Cross-Scale-Flows for Image-based Defect Detection"

1 / 1 papers shown
Title
LR-IAD:Mask-Free Industrial Anomaly Detection with Logical Reasoning
LR-IAD:Mask-Free Industrial Anomaly Detection with Logical Reasoning
Peijian Zeng
Feiyan Pang
Zhanbo Wang
Aimin Yang
60
45
0
28 Apr 2025
1