ResearchTrend.AI
  • Communities
  • Connect sessions
  • AI calendar
  • Organizations
  • Join Slack
  • Contact Sales
Papers
Communities
Social Events
Terms and Conditions
Pricing
Contact Sales
Parameter LabParameter LabTwitterGitHubLinkedInBlueskyYoutube

© 2026 ResearchTrend.AI, All rights reserved.

  1. Home
  2. Papers
  3. 2205.02698
  4. Cited By
Do Different Deep Metric Learning Losses Lead to Similar Learned
  Features?

Do Different Deep Metric Learning Losses Lead to Similar Learned Features?

IEEE International Conference on Computer Vision (ICCV), 2021
5 May 2022
Konstantin Kobs
M. Steininger
Andrzej Dulny
Andreas Hotho
ArXiv (abs)PDFHTML

Papers citing "Do Different Deep Metric Learning Losses Lead to Similar Learned Features?"

5 / 5 papers shown
Transparency Techniques for Neural Networks trained on Writer Identification and Writer Verification
Transparency Techniques for Neural Networks trained on Writer Identification and Writer Verification
Viktoria Pundy
Marco Peer
Florian Kleber
117
0
0
19 Jun 2025
Getting More for Less: Using Weak Labels and AV-Mixup for Robust
  Audio-Visual Speaker Verification
Getting More for Less: Using Weak Labels and AV-Mixup for Robust Audio-Visual Speaker VerificationInterspeech (Interspeech), 2023
Anith Selvakumar
H. Fashandi
VLM
294
1
0
13 Sep 2023
Data-Side Efficiencies for Lightweight Convolutional Neural Networks
Data-Side Efficiencies for Lightweight Convolutional Neural Networks
Bryan Bo Cao
Lawrence O'Gorman
Michael J. Coss
Shubham Jain
152
2
0
24 Aug 2023
InDiReCT: Language-Guided Zero-Shot Deep Metric Learning for Images
InDiReCT: Language-Guided Zero-Shot Deep Metric Learning for ImagesIEEE Workshop/Winter Conference on Applications of Computer Vision (WACV), 2022
Konstantin Kobs
M. Steininger
Andreas Hotho
VLM
91
8
0
23 Nov 2022
On Background Bias in Deep Metric Learning
On Background Bias in Deep Metric LearningInternational Conference on Machine Vision (ICMV), 2022
Konstantin Kobs
Andreas Hotho
145
1
0
04 Oct 2022
1