Semiconductor Defect Pattern Classification by Self-Proliferation-and-Attention Neural Network

1 December 2022

Papers citing "Semiconductor Defect Pattern Classification by Self-Proliferation-and-Attention Neural Network"

2 / 2 papers shown

Title
Semiconductor Wafer Map Defect Classification with Tiny Vision Transformers Faisal Mohammad Duksan Ryu 26 0 0 03 Apr 2025
MobileNets: Efficient Convolutional Neural Networks for Mobile Vision Applications Andrew G. Howard Menglong Zhu Bo Chen Dmitry Kalenichenko Weijun Wang Tobias Weyand M. Andreetto Hartwig Adam 3DH 950 20,561 0 17 Apr 2017