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Metric Learning Improves the Ability of Combinatorial Coverage Metrics
  to Anticipate Classification Error

Metric Learning Improves the Ability of Combinatorial Coverage Metrics to Anticipate Classification Error

International Conference on Software Testing, Verification and Validation Workshops (ICST), 2023
28 February 2023
Tyler Cody
Laura J. Freeman
    OODD
ArXiv (abs)PDFHTMLGithub

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