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Deep Learning of Crystalline Defects from TEM images: A Solution for the Problem of "Never Enough Training Data"
12 July 2023
Kishan Govind
D. Oliveros
A. Dlouhý
M. Legros
Stefan Sandfeld
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Papers citing
"Deep Learning of Crystalline Defects from TEM images: A Solution for the Problem of "Never Enough Training Data""
4 / 4 papers shown
Title
Self-Supervised Learning with Generative Adversarial Networks for Electron Microscopy
Bashir Kazimi
Karina Ruzaeva
Stefan Sandfeld
30
4
0
28 Feb 2024
Combining unsupervised and supervised learning in microscopy enables defect analysis of a full 4H-SiC wafer
Binh Duong Nguyen
Johannes Steiner
Peter Wellmann
Stefan Sandfeld
27
0
0
20 Feb 2024
Modeling Dislocation Dynamics Data Using Semantic Web Technologies
Ahmad Zainul Ihsan
Said Fathalla
Stefan Sandfeld
AI4CE
11
0
0
13 Sep 2023
Physics-driven Synthetic Data Learning for Biomedical Magnetic Resonance
Qinqin Yang
Zi Wang
Kunyuan Guo
C. Cai
X. Qu
PINN
OOD
MedIm
AI4CE
27
56
0
21 Mar 2022
1