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YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach
28 July 2023
Enrique Dehaerne
Bappaditya Dey
Hossein Esfandiar
L. Verstraete
H. Suh
S. Halder
S. de Gendt
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Papers citing
"YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach"
2 / 2 papers shown
Title
Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy
V. D. Ridder
Bappaditya Dey
Victor Blanco
Sandip Halder
B. Waeyenberge
9
3
0
19 Nov 2023
Training language models to follow instructions with human feedback
Long Ouyang
Jeff Wu
Xu Jiang
Diogo Almeida
Carroll L. Wainwright
...
Amanda Askell
Peter Welinder
Paul Christiano
Jan Leike
Ryan J. Lowe
OSLM
ALM
313
11,953
0
04 Mar 2022
1