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2309.03499
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Instance Segmentation of Dislocations in TEM Images
7 September 2023
Karina Ruzaeva
Kishan Govind
M. Legros
Stefan Sandfeld
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Papers citing
"Instance Segmentation of Dislocations in TEM Images"
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Self-Supervised Learning with Generative Adversarial Networks for Electron Microscopy
Bashir Kazimi
Karina Ruzaeva
Stefan Sandfeld
308
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28 Feb 2024
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