Wafer Map Defect Patterns Semi-Supervised Classification Using Latent Vector Representation

6 October 2023

Papers citing "Wafer Map Defect Patterns Semi-Supervised Classification Using Latent Vector Representation"

5 / 5 papers shown

Title
Advanced Clustering Framework for Semiconductor Image Analytics Integrating Deep TDA with Self-Supervised and Transfer Learning Techniques Janhavi Giri Attila Lengyel Don Kent Edward Kibardin 17 0 0 05 May 2025
Utilizing the Mean Teacher with Supcontrast Loss for Wafer Pattern Recognition Qiyu Wei Xun Xu Zeng Zeng Xulei Yang 65 0 0 27 Nov 2024
Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network Yin-Yin Bao Er-Chao Li Hong-Qiang Yang Bin-Bin Jia 36 2 0 17 Nov 2024
MobileNets: Efficient Convolutional Neural Networks for Mobile Vision Applications Andrew G. Howard Menglong Zhu Bo Chen Dmitry Kalenichenko Weijun Wang Tobias Weyand M. Andreetto Hartwig Adam 3DH 950 20,561 0 17 Apr 2017
Densely Connected Convolutional Networks Gao Huang Zhuang Liu L. V. D. van der Maaten Kilian Q. Weinberger PINN 3DV 252 36,362 0 25 Aug 2016