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Identity Overlap Between Face Recognition Train/Test Data: Causing Optimistic Bias in Accuracy Measurement
15 May 2024
Haiyu Wu
Sicong Tian
Jacob Gutierrez
Aman Bhatta
Kagan Öztürk
Kevin W. Bowyer
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Papers citing
"Identity Overlap Between Face Recognition Train/Test Data: Causing Optimistic Bias in Accuracy Measurement"
3 / 3 papers shown
Title
A Rapid Test for Accuracy and Bias of Face Recognition Technology
Manuel Knott
Ignacio Serna
Ethan Mann
Pietro Perona
42
0
0
20 Feb 2025
Vec2Face: Scaling Face Dataset Generation with Loosely Constrained Vectors
Haiyu Wu
Jaskirat Singh
Sicong Tian
Liang Zheng
Kevin W. Bowyer
CVBM
42
3
0
04 Sep 2024
GroupFace: Learning Latent Groups and Constructing Group-based Representations for Face Recognition
Y. Kim
Wonpyo Park
Myung-Cheol Roh
Jongju Shin
CVBM
44
88
0
21 May 2020
1