Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images

14 July 2024

Papers citing "Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images"

4 / 4 papers shown

Title
Defect Detection in Photolithographic Patterns Using Deep Learning Models Trained on Synthetic Data Prashant P. Shinde Priyadarshini P. Pai Shashishekar P. Adiga K. Subramanya Mayya Yongbeom Seo Myungsoo Hwang Heeyoung Go C. P 12 0 0 15 May 2025
ISP-AD: A Large-Scale Real-World Dataset for Advancing Industrial Anomaly Detection with Synthetic and Real Defects Paul J. Krassnig Dieter P. Gruber 113 0 0 06 Mar 2025
Diffusion Models in Vision: A Survey Florinel-Alin Croitoru Vlad Hondru Radu Tudor Ionescu M. Shah DiffM VLM MedIm 191 1,138 0 10 Sep 2022
RePaint: Inpainting using Denoising Diffusion Probabilistic Models Andreas Lugmayr Martin Danelljan Andrés Romero F. I. F. Richard Yu Radu Timofte Luc Van Gool DiffM 213 1,354 0 24 Jan 2022