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SEM-CLIP: Precise Few-Shot Learning for Nanoscale Defect Detection in Scanning Electron Microscope Image

SEM-CLIP: Precise Few-Shot Learning for Nanoscale Defect Detection in Scanning Electron Microscope Image

24 February 2025
Qian Jin
Yuqi Jiang
Xudong Lu
Yumeng Liu
Yining Chen
Dawei Gao
Qi Sun
Cheng Zhuo
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Papers citing "SEM-CLIP: Precise Few-Shot Learning for Nanoscale Defect Detection in Scanning Electron Microscope Image"

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