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Frequency Bias Matters: Diving into Robust and Generalized Deep Image Forgery Detection

Frequency Bias Matters: Diving into Robust and Generalized Deep Image Forgery Detection

IEEE Transactions on Dependable and Secure Computing (IEEE TDSC), 2025
25 November 2025
Chi Liu
Tianqing Zhu
Wanlei Zhou
Wei Zhao
    AAML
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