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You Better Look Twice: a new perspective for designing accurate detectors with reduced computations
British Machine Vision Conference (BMVC), 2021
21 July 2021
Alexandra Dana
M. Shutman
Yotam Perlitz
Ran Vitek
Tomer Peleg
R. Jevnisek
ObjD
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Papers citing
"You Better Look Twice: a new perspective for designing accurate detectors with reduced computations"
2 / 2 papers shown
Hybrid Classification-Regression Adaptive Loss for Dense Object Detection
Yanquan Huang
Liu Wei Zhen
Yun Hao
Mengyuan Zhang
Qingyao Wu
Zikun Deng
Xueming Liu
Hong Deng
312
2
0
30 Aug 2024
YOLO9000: Better, Faster, Stronger
Computer Vision and Pattern Recognition (CVPR), 2016
Joseph Redmon
Ali Farhadi
VLM
ObjD
828
17,440
0
25 Dec 2016
1
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