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Exploring the Relationship between Samples and Masks for Robust Defect
  Localization

Exploring the Relationship between Samples and Masks for Robust Defect Localization

19 June 2023
Jiangke Lin
Yaping Yan
ArXivPDFHTML

Papers citing "Exploring the Relationship between Samples and Masks for Robust Defect Localization"

2 / 2 papers shown
Title
Anomaly Detection via Reverse Distillation from One-Class Embedding
Anomaly Detection via Reverse Distillation from One-Class Embedding
Hanqiu Deng
Xingyu Li
UQCV
104
448
0
26 Jan 2022
Image-to-Image Translation with Conditional Adversarial Networks
Image-to-Image Translation with Conditional Adversarial Networks
Phillip Isola
Jun-Yan Zhu
Tinghui Zhou
Alexei A. Efros
SSeg
212
19,447
0
21 Nov 2016
1