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2306.10720
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Exploring the Relationship between Samples and Masks for Robust Defect Localization
19 June 2023
Jiangke Lin
Yaping Yan
Re-assign community
ArXiv
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Papers citing
"Exploring the Relationship between Samples and Masks for Robust Defect Localization"
2 / 2 papers shown
Title
Anomaly Detection via Reverse Distillation from One-Class Embedding
Hanqiu Deng
Xingyu Li
UQCV
104
448
0
26 Jan 2022
Image-to-Image Translation with Conditional Adversarial Networks
Phillip Isola
Jun-Yan Zhu
Tinghui Zhou
Alexei A. Efros
SSeg
212
19,447
0
21 Nov 2016
1