Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review

16 August 2023

Papers citing "Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review"

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Title
Stochastic Optimization of Plain Convolutional Neural Networks with Simple methods Yahia Saeed Assiri BDL 51 22 0 24 Jan 2020
SMOTE: Synthetic Minority Over-sampling Technique Nitesh V. Chawla Kevin W. Bowyer Lawrence Hall W. Kegelmeyer AI4TS 160 25,244 0 09 Jun 2011