 Multimodal Detection of Fake Reviews using BERT and ResNet-50International Conference on Innovative Mechanisms for Industry Applications (ICIMIA), 2025 |
 Exploring "Many in Few" and "Few in Many" Properties in Long-Tailed, Highly-Imbalanced IC Defect ClassificationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2025 |
 Connecting Domains and Contrasting Samples: A Ladder for Domain GeneralizationKnowledge Discovery and Data Mining (KDD), 2025 |
