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TransferD2: Automated Defect Detection Approach in Smart Manufacturing
  using Transfer Learning Techniques

TransferD2: Automated Defect Detection Approach in Smart Manufacturing using Transfer Learning Techniques

26 February 2023
Atah Nuh Mih
Hung Cao
J.L. Pickard
Monica Wachowicz
R. Dubay
ArXivPDFHTML

Papers citing "TransferD2: Automated Defect Detection Approach in Smart Manufacturing using Transfer Learning Techniques"

2 / 2 papers shown
Title
Xception: Deep Learning with Depthwise Separable Convolutions
Xception: Deep Learning with Depthwise Separable Convolutions
François Chollet
MDE
BDL
PINN
201
14,190
0
07 Oct 2016
Improving neural networks by preventing co-adaptation of feature
  detectors
Improving neural networks by preventing co-adaptation of feature detectors
Geoffrey E. Hinton
Nitish Srivastava
A. Krizhevsky
Ilya Sutskever
Ruslan Salakhutdinov
VLM
243
7,597
0
03 Jul 2012
1